Wykład zatytułowany Recent Advances in Atom Probe Tomography wygłosi dr Peter Clifton (Cameca, Fitchburg, USA).
A number of innovations in Atom Probe instrument design have recently become available, which have had a significant impact on the range and types of materials that can be studied. These changes include full cryo-specimen preparation and transfer, the adoption of shorter wavelength (DUV) laser pulsing, larger solid angle detection systems for increased field of view, and the introduction of a new voltage plus laser pulsed data acquisition mode. Each of these developments will be introduced and the examples of the benefits will be shown and discussed.