„Advanced Characterization of Nanoscale Materials using Atom Probe Tomography” – seminarium ACMiN

Akademickie Centrum Materiałów i Nanotechnologii AGH zaprasza na seminarium, które odbędzie się 9 grudnia 2015 r. o godz. 11.30.


Referat pt. „Advanced Characterization of Nanoscale Materials using Atom Probe Tomography” wygłosi dr Peter Clifton (Sales Manager EMEA, CAMECA – AMETEK).


Miejsce: ul. Kawiory 30, bud. D-16, sala audytoryjna ACMiN (1.02A).

„Advanced Characterization of Nanoscale Materials using Atom Probe Tomography”

In the 15 years or so since the introduction of the first commercially-available Atom Probe Tomography (APT) instruments the improvements in the capability of the technique have been quite remarkable. Whilst still maintaining the unique capability to detect, identify and position individual atoms with near atomic resolutions in three dimensions, analysis volumes have increased dramatically, improved detector performance and mass resolving power has produced real enhancements in detection sensitivities, compositional accuracy and precision, and the introduction of laser mode has enabled analysis of very many material systems beyond traditional bulk metals. In addition, the maturation of FIB-based specimen preparation methods has made site-specific analyses truly routine.


This presentation will provide an overview of the APT technique and recent developments but the bulk of the time will be spent reviewing the diverse range of material science applications which can be addressed by APT. These examples will include bulk and hybrid metals systems and well as a variety of functional materials, complex structures and devices.


Peter Clifton read Physics at the University of Birmingham (UK) and gained his doctorate degree studying the interfaces between diamond and metal thin films using a variety of surface science methods. Following a period of post-doctoral research investigating structures used in magnetic data storage applications, Peter joined Seagate Technology R & D in 1998 and worked on areas such as advanced tribology, and the growth and characterization of new magnetic recording head device structures. This was a dynamic period for the data storage industry and rapid increases in areal density were achieved by the introduction of revolutionary new sensor technologies such as GMR and TMR. In 2004 he joined Oxford Nanoscience Ltd – the UK-based supplier of Atom Probe instruments – as a senior atom probe scientist. His responsibilities included establishing and running the applications lab, providing customer training and the development of new applications. He also participated in the development of key new instrument technologies such as the large angle reflectron and laser-assisted atom probe tomography. These activities continued after the merger of ONS by Imago Scientific Instruments (2006) and the consolidation of Imago into Cameca (2010).


Peter has been working with the atom probe technique for nearly 20 years. This has included time as a research assistant within the Oxford Materials Department Atom Probe Group (working with Profs. Alfred Cerezo and George Smith) and as well as a variety of engineering and scientific roles with Seagate Technology, ONS, Imago and CAMECA. He was a key contributor to the pioneering development of APT applications with wafer-deposited thin film structures, including GMR and TMR stacks for data storage applications and his research interests have remained concentrated on expanding the range of materials that can be successfully and usefully analyzed using APT, as well as removing the barriers to widespread adoption of this exciting technique. He has presented invited talks and papers at a wide variety of international conferences, seminars and workshops and has published more than 45 APT-related papers.