16.01.2020

A new view on the origin of material properties: Time-of-flight momentum microscopy – seminar


Academic Centre for Materials and Nanotechnology AGH UST invites for a seminar that will be held on 16th January, 2020, at 4.00 pm.

A lecture titled “A new view on the origin of material properties: Time-of-flight momentum microscopy” will be given by prof. dr. Hans Joachim Elmers (Johannes Gutenberg University Mainz, Institute for Physics, Germany).

Venue: Academic Centre for Materials and Nanotechnology AGH UST (Kawiory 30 Street, building D-16, auditorium room 1.02A)

Abstract

The origin of all material properties lies in the spin- and momentum dependent electronic states. Spin-resolved photoemission spectroscopy, being the most direct experimental method for the determination of electronic states in condensed matter, used to suffer from long acquisition times and elaborate surface preparation techniques. We overcome these obstacles by using high energy X-ray excitation in combination with a the novel recording scheme of time-of-flight momentum microscopy allowing for a three-dimensional data recording scheme of the photoemission intensity as a function of parallel momentum and binding energy.